Alina Lyuleeva at the Atomic Force Microscope (IMAGE)

Technical University of Munich (TUM)

Alina Lyuleeva at the Atomic Force Microscope

Caption

Alina Lyuleeva from the Institute of Nanoelectronics at Technical University of Munich at the at the atomic force microscope with which the silicon nanosheets were characterized.

Credit

Uli Benz / TUM

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