Phase structure and microstructure analysis of CuxBi2Te2.7Se0.3 sample (IMAGE)

Science China Press

Phase structure and microstructure analysis of CuxBi2Te2.7Se0.3 sample

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(a) XRD patterns of SPS-sintered CuxBi2Te2.7Se0.3 (x =0-0.02). (b) Lattice parameters of CuxBi2Te2.7Se0.3, the inset shows the crystal structure of Bi2Te3. The TEM analysis of CuxBi2Te2.7Se0.3 sample. (c, d) The ADF image and corresponding EDS element maps of Bi, Te, Se, and Cu, respectively. (e, f) The enlarged HAADF images of CuxBi2Te2.7Se0.3. (g) HAADF image of pristine Bi2Te2.7Se0.3 without Cu. (h) HAADF image of Cu0.01Bi2Te2.7Se0.3 sample.

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