Unraveling the time-dependent dynamics of superconducting tapes: The crucial role of heat accumulation

In the realm of superconducting technologies, the dynamic resistance voltage of high-temperature superconductor (HTS) tapes is a critical parameter that influences the performance of devices such as flux pumps, motors, and superconducting magnets. A recent study delves into the time-dependent development of this dynamic resistance voltage, considering the effects of heat accumulation, which can significantly alter the operating temperature of HTS tapes and, consequently, their resistance voltage.

The research "Time-dependent development of dynamic resistance voltage of superconducting tape considering heat accumulation" presented in this article employs a numerical modeling approach to investigate the time-dependent behavior of dynamic resistance voltage in HTS tapes when subjected to an oscillating magnetic field. The study validates its findings against experimental results, providing a comprehensive analysis of how various factors, including the structure of the HTS tape, contribute to the dynamic resistance voltage's development over time.

The study concludes that heat accumulation is the primary factor responsible for the time-dependent behavior of dynamic resistance voltage in superconducting tapes. This revelation is supported by both experimental and simulation tests, emphasizing the importance of considering heat accumulation, especially when dealing with significant dynamic resistance voltages.

Impact of Copper Layer Thickness

A significant part of the research focuses on the role of copper layers within the HTS tape. The thickness of these layers was found to have minimal impact on the development rate of dynamic resistance voltage under low field conditions. However, in high field scenarios, thinner copper layers lead to a more pronounced time-dependent increase in dynamic resistance voltage. This is attributed to the increased unit net Joule heat generated and the consequent rise in the temperature of the HTS tape.

Recovery Time of Dynamic Resistance Voltage

The study also uncovers the significant influence of HTS tape's copper layers on the recovery time of dynamic resistance voltage. It is observed that thinner copper layers in the HTS tape construction necessitate longer recovery times. The net Joule heat, which is controlled by the copper layer thickness, dictates the recovery time of the dynamic resistance voltage when the thickness is constant.

The research team of this study believes that understanding the intricate relationship between heat accumulation and dynamic resistance voltage is essential for advancing the design and operation of superconducting devices. They highlight the need for further research to optimize the copper layer thickness in HTS tapes to balance performance and efficiency, especially in high-field applications.

This groundbreaking research sheds light on the complex dynamics of HTS tapes, emphasizing the pivotal role of heat accumulation in their performance. By providing a deeper understanding of the time-dependent behavior of dynamic resistance voltage, this study paves the way for improvements in the reliability and efficiency of superconducting technologies.