Fig. 3: Morphology—Surface topography and molecular stacking. (IMAGE)

The Hong Kong Polytechnic University

Fig. 3: Morphology—Surface topography and molecular stacking.

Caption

AFM height images of Y6 films (a, e) and PM6:Y6 films (b, f) with DIO and TCB treatment. 2D GIWAXS diffraction patterns (c, g) and 1D GIWAXS diffraction patterns (d) of PM6:Y6 blend films with DIO and TCB treatment. h The areas of π-π and lamellar diffraction peak for PM6:Y6 blend films with DIO and TCB treatment. Source data are provided as a Source Data file.

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© 2023 Research and Innovation Office, The Hong Kong Polytechnic University

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