Sample Holder for Silicon Test (IMAGE) Georgia Institute of Technology Caption Shown is a sample holder used to test samples of lithiated silicon to determine its nano-mechanical properties. The device was used to develop a detailed nano-mechanical study of mechanical degradation processes in silicon thin films. Credit Credit: Rob Felt, Georgia Tech Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.