Testing Thin-Film Silicon Material (IMAGE)

Georgia Institute of Technology

Testing Thin-Film Silicon Material

Caption

Professor Ting Zhu and Assistant Professor Suman Xia, both from Georgia Tech's Woodruff School of Mechanical Engineering, show how a thin film electrode made of amorphous silicon was tested in a custom environmental indenter. To provide proper environmental control, samples containing lithiated silicon were tested with the device inside the glove box shown in the background.

Credit

Credit: Rob Felt, Georgia Tech

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