Silicon Anode Test Equipment (IMAGE) Georgia Institute of Technology Caption Shown are details of a custom environmental indenter used to test thin film electrodes made of amorphous silicon. The device was used to develop a detailed nano-mechanical study of mechanical degradation processes in silicon thin films. Credit Credit: Rob Felt, Georgia Tech Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.