单器件循环测试I-V曲线 (IMAGE)

Science China Press

单器件循环测试I-V曲线

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（a）平面、（b）S1、（c）S2、（d）S3 RRAM器件的单器件循环I-V曲线。锥型器件具有相对优异的转变均匀性。

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©《中国科学》杂志社

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