Gallium Nitride-Silicon Carbide Devices (IMAGE) Georgia Institute of Technology Caption Closeup image shows polished GaN-SiC samples bonded by the surface-activated bonding technique. Credit Rob Felt, Georgia Tech Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.