Reliable, High-speed MTJ Technology for 1X nm STT-MRAM and NV-Logic Has Wide Applications (IMAGE)

Tohoku University

Reliable, High-speed MTJ Technology for 1X nm STT-MRAM and NV-Logic Has Wide Applications

Caption

Figure 2: (a) Thermal stability factor of the novel quad-MTJ structure compared with those with the conventional double-MTJ structure. (b) Writing current density of 33nm-diameter quad MTJs compared with those with the 30nm-diameter double MTJs.

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IEEE & Tohoku University

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Credit: IEEE & Tohoku University

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