Reliable, High-speed MTJ Technology for 1X nm STT-MRAM and NV-Logic Has Wide Applications (IMAGE)

Tohoku University

Reliable, High-speed MTJ Technology for 1X nm STT-MRAM and NV-Logic Has Wide Applications

Caption

Figure 3: Endurance results of the 33 nm-diameter quad-MTJ. Although the quad-MTJ enhances the &Delta; by a factor of <sup>~</sup>2, endurance of its MTJ exceeds at least 10<sup>11</sup>

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IEEE & Tohoku University

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IEEE & Tohoku University

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