image: This figure shows optical micrographs (left) of a copper TEM grid (top) through which a sample was irradiated and the resultant surface pattern after laser exposure of a substrate with template on top (bottom). The middle and right show atomic force microscopy images after laser annealing and template removal revealing a hierarchical surface topography of regions with and without surface nanostructure (pillars). Scan size is 2 micrometer x 2 micrometers (middle and right) and the I–bar (right) along the z-axis is 40 nm. The line scan in green reveals edge effects resulting from the laser annealing through a mask. This image relates to an article that appeared in the Oct. 8, 2010, issue of Science, published by AAAS. The study, by Dr. Hitesh Arora of Cornell University in Ithaca, N.Y., and Intel Corporation in Chandler, Ariz., and colleagues was titled, "Block Copolymer Self-Assembly–Directed Single-Crystal Homo- and Heteroepitaxial Nanostructures." view more
Credit: Image courtesy of Uli Wiesner, Cornell University