TOC (IMAGE)

Helmholtz-Zentrum Berlin für Materialien und Energie

TOC

Caption

The principle of correlative atomic force microscopy in contact mode: a fine tip at the end of a cantilever scans the surface. This allows force interactions between the tip and the sample surface to be measured, including frictional forces. If a voltage is also applied, the electric current flowing through the contact can also be measured.

Credit

M.Munz/FHI/HZB

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License

CC BY-SA

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