X-ray Data and SEM Images of New Nanostructures (IMAGE)

DOE/Brookhaven National Laboratory

X-ray Data and SEM Images of New Nanostructures

Caption

X-ray scattering data (left) are shown alongside corresponding scanning-electron microscopy images (right) of key areas in the sample identified by the AI algorithm. The images revealed three novel nanopatterns: alternating lines (top), skew (center), and ladder (bottom). Scale bar is 500 nanometers.

Credit

Brookhaven National Laboratory

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