Figure 2 (IMAGE)

Tohoku University

Figure 2

Caption

The left side shows the thermal stability vs. temperature for the Hexa-MTJ developed in this study, and the conventional Double-interface MTJ. The right side displays the number of write cycles (endurance) of the Hexa-MTJ. The endurance of Hexa-MTJ exceeds at least 1 × 107, which is sufficient for eFlash applications

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IEEE & Tohoku University

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