The figure shows (a) a schematic drawing of the experimental setup; (b) a cross-section of the 3D transfer function for an interference microscope with a high numerical aperture; and (c) a cross-section of a simulated interference image stack of a sinusoidal surface when imaging through a microsphere. (IMAGE)

SPIE--International Society for Optics and Photonics

The figure shows (a) a schematic drawing of the experimental setup; (b) a cross-section of the 3D transfer function for an interference microscope with a high numerical aperture; and (c) a cross-section of a simulated interference image stack of a sinusoidal surface when imaging through a microsphere.

Caption

The figure shows (a) a schematic drawing of the experimental setup; (b) a cross-section of the 3D transfer function for an interference microscope with a high numerical aperture; and (c) a cross-section of a simulated interference image stack of a sinusoidal surface when imaging through a microsphere.

Credit

The Authors, doi 10.1117/1.JOM.2.4.044501

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