Figure 3. The heterogeneity of sEVs and size limitation of UCNPs. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 3. The heterogeneity of sEVs and size limitation of UCNPs.

Caption

(a) Positive Y axis: The measured intensity profiles along the increasing number of UCNPs per single EVs. Insets: representative single diffraction-limited spots with the intensity correlated to the number of UCNPs per spot. Negative Y axis: Statistical distribution of the measured intensity profiles over the counted spots, respectively. (b) Comparison between the confocal image and super-resolution image of the same area using 27nm UCNPs. (c) Cross-sectional profiles of two adjacent UCNPs correspondence to the boxed region in (b). (d) Comparison of confocal imaging and super-resolution imaging of the same area using 21nm UCNPs. (e) Cross-sectional profiles of two adjacent UCNPs correspondence to the boxed region in (d).

Credit

by Guan Huang, Yongtao Liu, Dejiang Wang, Ying Zhu, Shihui Wen, Juanfang Ruan, Dayong Jin

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