Magnetic characterizations and theoretical calculations of PtTe2Ge1/3 (IMAGE)
Caption
(a) Out-of-plane Kerr signal measured at 300 K. The insets show the images captured by Kerr microscope under positive and negative magnetic fields. (b) Cr L2,3-edge X-ray absorption measurements performed using the right-circular polarized (RCP) and left-circular polarized (LCP) lights in an applied magnetic field of 4.5 kOe at 200 K and the corresponding difference of two X-ray absorption spectra signals shows the absence of X-ray magnetic circular dichroism (XMCD) of Cr element. The relative intensity compared to the background is exhibited. (c) Density of states calculations of Ge atoms located at the interstitial position between two Te atoms and the substitution position of Te atoms. Corresponding lattice structures are shown in the insets. Yellow, blue and green balls represent Pt, Te and Ge atoms, respectively. (d) Schematic of transport measurement setup and the optical microscope image of the device. Scale bar: 10 μm. (e) Out-of-plane magnetic field dependent anomalous Hall resistance (RH) at representative temperatures from 200 to 370 K of PtTe2Ge1/3. (f) Arrott plots of PtTe2Ge1/3 at 300 and 370 K. (g) Kerr signals of the sample measured at room temperature after exposed in air for days. The inset exhibits the optical microscope image of the sample. Scale bar: 10 μm.
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