Image 2 (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

Image 2

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Image 2. Retraining operation in the neuromorphic device array. a) Schematic graph showing the retraining effect. b) Scanning electron microscope image of the neuromorphic device array. c) Training pattern “F” for the retraining test. d) Evolution of the memory state of the neuromorphic device array for the naive training and retraining scheme.

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KAIST

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