Deep learning in optical metrology. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Deep learning in optical metrology.

Caption

Because of the significant changes that deep learning brings to the concept of optical metrology technology, almost all elementary tasks of digital image processing in optical metrology have been reformed by deep learning.

Credit

by Chao Zuo, Jiaming Qian, Shijie Feng, Wei Yin, Yixuan Li, Pengfei Fan, Jing Han, Kemao Qian, and Qian Chen

Usage Restrictions

Credit must be given to the creator.

License

CC BY

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