Deep learning in optical metrology. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Deep learning in optical metrology.

Caption

Deep learning is creating new applications in optical metrology. As an example demonstrated by the figure, the phase of the fringe pattern acquired from a Fizeau interferometer can be demodulated by deep learning with both high accuracy and high efficiency.

Credit

by Chao Zuo, Jiaming Qian, Shijie Feng, Wei Yin, Yixuan Li, Pengfei Fan, Jing Han, Kemao Qian, and Qian Chen

Usage Restrictions

Credit must be given to the creator.

License

CC BY

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