Convergent-beam Microscopy (IMAGE) California Institute of Technology Caption This is the diffraction obtained for silicon with 4D electron microscopy. The nanoscale can be determined from the patterns the structure. Credit Zewail/Science/AAAS Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.