Switching Error Rate (IMAGE) Tohoku University Caption This image shows the experimentally obtained switching error rate as a function of applied current density for two devices with different material systems. Duration of current pulse is 0.5 ns. For both materials, 500-times switching for 500-times trial is obtained with a sufficiently small current density. Credit Shunsuke Fukami Usage Restrictions Credit: Shunsuke Fukami License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.