X-ray Diffraction (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption The diffraction imaging layout at beamline 9.0.1: from left, coherent x-rays illuminate the sample (center), which is mounted on a silicon nitride window just 50 nanometers thick in a movable frame. Diffraction patterns at various orientations are measured using a downstream CCD camera, right. A beamstop prevents the direct beam from striking the CCD; multiple exposure times are summed to expand the CCD's dynamic range. Credit Lawrence Berkeley National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.