Measuring System (IMAGE) Technical University of Munich (TUM) Caption The measurement system is designed hierarchically and involves microscopic beams, at the tips of which one or more double helix structures running in parallel are located. These have been modified such that each end carries one base pair. Two of these microscopic beams are connected with a flexible polymer. Credit Christoph Hohmann & Hendrik Dietz/ Nano Initiative Munich/ TUM Usage Restrictions Credit must be stated as indicated. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.