Amar Tests First-Passage-Time/KMC Approach (IMAGE) Ohio Supercomputer Center Caption The University of Toledo’s Jacques Amar, Ph.D., leveraged Ohio Supercomputer Center systems to test an accelerated approach to simulating thin film growth. Using two different models (fcc and SOS), Amar compared the regular Kinetic Monte Carlo method (figures A and C) with a first-passage-time approach coupled with the KMC method (figures B and D). Credit Amar/University of Toledo Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.