Electrical Resistivity Measurement Device (IMAGE) DOE/Brookhaven National Laboratory Caption An example of a typical device that the scientists use to measure electrical resistivity as a function of temperature and magnetic field. The scientists grew the film via atomic layer-by-layer molecular beam epitaxy, patterned it into a device, and wire bonded it to a chip carrier. Credit Brookhaven National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.