Durgin Testbed Parts (IMAGE) Georgia Institute of Technology Research News Caption Components of the testbed Georgia Tech's Gregory Durgin developed to simultaneously measure hundreds of radio frequency identification RFID tags and rapidly test new RFID tag prototypes. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.