The Temperature Dependence of the Time Constants in the TR-PL and μ-PCD Decay Curves (IMAGE)

Nagoya Institute of Technology

The Temperature Dependence of the Time Constants in the TR-PL and μ-PCD Decay Curves

Caption

At low temperatures, holes are trapped in H1 and take long to recombine with electrons in EC due to difficulty in electron capture. At high temperatures, the holes escape to EV and recombine with electrons through the recombination channel.

Credit

Image courtesy: Masashi Kato from Nagoya Institute of Technology

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