AFM and Thermal Cantilever (IMAGE) Georgia Institute of Technology Caption This image shows an atomic force microscope (AFM) modified with a thermal cantilever. The AFM scanner allows for precise positioning on the nanoscale while the thermal cantilever induces local nanoscale chemical reactions. Credit Georgia Institute of Technology Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.