Piezoelectricity in MoS2 (1 of 2) (IMAGE)

DOE/Lawrence Berkeley National Laboratory

Piezoelectricity in MoS2 (1 of 2)

Caption

To measure in-plane piezoelectric stress, an MoS2 film was suspended on HSQ posts and clamped by two Au electrodes. When the film was indented with a scanning AFM probe, the induced stress changed the load on the cantilever, which was observed by the deflection of a laser beam.

Credit

(Image courtesy of Xiang Zhang, Berkeley Lab)

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