Ferroelectric nanostructures AFM (IMAGE) Georgia Institute of Technology Caption This image shows the topography (by atomic force microscope) of a ferroelectric PTO line array crystallized on a 360-nanometer thick precursor film on polyimide. The scale bar corresponds to one micron. Credit Courtesy Suenne Kim Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.