AFM Holder (IMAGE) Georgia Institute of Technology Research News Caption An AFM holder adapted so that the FIRAT probe can be used on existing AFM systems. The FIRAT probe can simultaneously measure topography and material properties including adhesion, stiffness, elasticity and viscosity. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.