Testing Berkeley Lab CCDs for DECam (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption Wafers holding four CCDs were fabricated through the first stages at Teledyne DALSA and completed in Berkeley Lab’s MicroSystems Laboratory, then tested at -45 degrees C. Final testing and mounting were done at Fermilab. Credit Lawrence Berkeley National Laboratory Usage Restrictions with credit as given License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.