AFM (IMAGE) Science China Press Caption This is an atomic force microscope (AFM) and scanning thermal microscopy (SThM) schematics with thermal conductivity, topography, and back scattered electron (BSE) mappings, respectively from top to bottom. Image courtesy of E.N. Esfahani, University of Washington. Credit ©Science China Press Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.