Figure 3 (IMAGE)

Pohang University of Science & Technology (POSTECH)

Figure 3

Caption

Operational stability analysis of perovskite thin-film transistors fabricated by the optimized process. (a) Continuous on/off switch test with 2,000 cycles (b) 100 consecutive measurements of one optimized transistor (c) Recovery time according to the bias voltage of a transistor.

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POSTECH

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