Characterization of samples (IMAGE)

Science China Press

Characterization of samples

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(a) XRD patterns of the synthesized thin film. (b) TEM image of the thin film (the scale bar is 5 nm). (c) Zoomed-in TEM image showing lattice fringes on the thin film sample (the scale bar is 2 nm). (d) TEM image of a thicker area within the thin film (the scale bar is 1 nm). (e) Photoluminescence image of fibers on a SiO2/Si substrate (the scale bar is 50 μm). (f) Photoluminescence image of a thin film transferred onto a SiO2/Si substrate (the scale bar is 20 μm).

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