Trapping by three different types of defects in a perovskite (IMAGE)

Okinawa Institute of Science and Technology (OIST) Graduate University

Trapping by three different types of defects in a perovskite

Caption

The researchers conducted a time-resolved photoemission experiment to understand the role of each defect in perovskite performance. As can be seen in the graph on the right, the grain boundary defects, despite their small size, were the most detrimental for charge carrier trapping, which results in undesirable performance losses for the solar cell.

Credit

OIST

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