NanoSIMS images of a SiC grain (IMAGE)

Washington University in St. Louis

NanoSIMS images of a SiC grain

Caption

NanoSIMS images of a SiC grain. The upper panel shows images taken at a spatial resolution of ~1 μm, the typical resolution of previous analyses. The lower panel shows the same grain’s ion images taken at a spatial resolution of 100 nm, the resolution achieved in this study.

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Image courtesy of Nan Liu

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