Experimental Setup Schematic for Studying Melting in Polycrystalline Gold Thin Films (IMAGE)

DOE/Brookhaven National Laboratory

Experimental Setup Schematic for Studying Melting in Polycrystalline Gold Thin Films

Caption

A schematic of the experimental setup for the time-resolved X-ray diffraction studies on the polycrystalline gold thin films. The sample is mounted perpendicular to the XFEL beam. A laser "pump" excites the sample, and then an X-ray pulse "probe" monitors the laser-induced changes at different time delays. The inset shows the X-ray diffraction patterns generated for the 300-nanometer film 50 picoseconds before and 100, 220, and 390 picoseconds after laser excitation.

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Brookhaven National Laboratory

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