Saving energy by taking a close look inside transistors (IMAGE)

Friedrich-Alexander-Universität Erlangen-Nürnberg

Saving energy by taking a close look inside transistors

Caption

Physicist Martin Hauck fits a silicon carbide transistor into the measuring apparatus: researchers at FAU have discovered a method for finding defects at the interfaces of switches.

Credit

FAU/Michael Krieger, Martin Hauck

Usage Restrictions

The image may only be used with appropriate caption or credit.

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.