Electrical Transport Measurements (IMAGE)

Tokyo Institute of Technology

Electrical Transport Measurements

Caption

This is a schematic figure of the four-point probe used for analyzing the electron transport properties in ultrahigh vacuum. The superconductor is one unit-layer (UL) NbSe2 grown on a bilyer graphene (BLG) on SiC substrate.

Credit

<i>Physical Review B</i>

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