Mesoporous Silicon Nanowires Scanned By A Focused Laser Beam (IMAGE)
Caption
Mesoporous silicon nanowires were scanned by a focused laser beam in two different patterns, imaged by bright-field optical microscope, as depicted by (a) and (c), as well as fluorescence microscopy, as depicted by (b) and (d). Evidently, the images hidden in boxes shown in (a) and (c) are clearly revealed under fluorescence microscopy.
Credit
National University of Singapore
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