Scanning Electron Microscope (SEM) Images (Fig.1) (IMAGE)

Toyohashi University of Technology (TUT)

Scanning Electron Microscope (SEM) Images (Fig.1)

Caption

Scanning electron microscope (SEM) images of Sn4P3/C composite particles (1st row:1st image), and surface of Sn4P3/C composite film fabricated by the AD process (1st row:3rd image). Corresponding elementary distributions for Sn, P, and C are also shown.

Credit

Copyright (C) Toyohashi University of Technology. All Rights Reserved.

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.