The Structure of the New Material (IMAGE) Moscow Institute of Physics and Technology Caption This image was obtained by atomic force microscopy (AFM). The principle of the method is to "probe" a sample with a thin tip at the end of a tiny cantilever that scans the profile with a resolution down to nanometers (in some cases, it distinguishes even atom-size protrusions). Credit The picture is courtesy of the researchers. Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.