Fig. 2 (IMAGE) Science China Press Caption (a) Sensitivity curve and microstructure deformation cross-section SEM image. (b) Compression cross-section SEM images and contact area change curves of materials with different elastic modulus and micropillared structure under pressure. Credit ©Science China Press Usage Restrictions Use with credit. License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.