SWAPPS Depth Profile (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption SWAPPS measures the depth profiles of chemical elements with sub-nanometer resolution in the direction perpendicular to the interface, utilizing an X-ray standing wave field that can be tailored to focus on specific depths, i.e., near the surface or near the iron oxide interface. Credit (Image courtesy of Chuck Fadley) Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.