Near-Field IR Imaging of Graphene (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption In the bilayer graphene imaging work by Feng Wang and his group, IR light (yellow) is focused onto the apex of a metal-coated AFM tip and the backscattered infrared radiation is collected and measured. Credit Image courtesy of Feng Wang, Berkeley Lab Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.