Beam Profile (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption This image shows the profile of an electron beam at Berkeley Lab's Advanced Light Source synchrotron, represented as pixels measured by a charged coupled device (CCD) sensor. When stabilized by a machine-learning algorithm, the beam has a horizontal size dimension of 49 microns root mean squared and vertical size dimension of 48 microns root mean squared. Demanding experiments require that the corresponding light-beam size be stable on time scales ranging from less than seconds to hours to ensure reliable data. Credit Lawrence Berkeley National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.