Determination of framework precise structure and locations of Al in the H-ZSM-5 zeolite. (IMAGE)
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Integrated reflection intensities of experimentally observed H-ZSM-5 (A) absolute intensity and (B) change in intensity relative to lowest incident energy 1540 eV. arb., arbitrary. (C) Rietveld refinement against experimental diffraction data at 1569 eV. (D) The overall refined Al occupancy from the five energies with the constraint on total occupancy. Inset shows the refined occupancy of Al in each T-site based on the constraint of the Al content determined by inductively coupled plasma mass spectrometry (ICP-MS). (E and F) The refined framework Al locations at T4 (sinusoidal channel), T6 (intersection void), and T8 (straight channel) are viewed along the [010] and [100] projections. Experimental details of RSXRD and SXRD, validities, errors, and sensitivities can be found in the SM (figs. S1 to S24 and tables S1 to S6).
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